Category

OEM

Model

Tool/Description

Assembly

Accent

Q7

Assembly

ADE

6034

Wafer Measurement

Assembly

ADE

9350

Wafer Test System, 200mm Wafers

Assembly

ADE

3046A

Wafer Thickness, Taper & Bow Tester

Assembly

ADE

7900 Ultra Gage

Multifunction Dimensional Measurements for 500nm design rule

Assembly

ADE

8100-14

Wafer Tester with Wafer Shape, High Resistivity and Type Testing

Assembly

ADE

ADE 9700

Assembly

ADE

EpiScan 1000

High-speed film thickness measurement and mapping tool

Assembly

ADE

Ultra Gage 9500

Assembly

ADE 9500 Ultragage 

Ultragage 9500

Assembly

ADEC

ADE 9500

Assembly

ADEC

BT1152-240

ADEC 1152 Board Tester

Assembly

ADE-DMS

780 MRT

Digital Measurement System

Assembly

Advantest

M6761A

Retho Test ATE

Assembly

Advantest

M6761AD

Retho Test ATE

Assembly

Advantest

T3324

Memory Tester

Assembly

Advantest

T5363P

Memory Tester

Assembly

Advantest

T5363P

Memory Tester

Assembly

Advantest

T5365P

Memory Test in Device

Assembly

Advantest

T5365P

Memory Test in Device

Assembly

Advantest

T5365P

Memory Test in Device

Assembly

Advantest

T5382A

Memory Tester (Dual head with MRAA)

Assembly

Advantest

T5382A

Memory Tester (Single head#1)

Assembly

Advantest

T666AF

ESD Tester

Assembly

Advantest

T6673

Digital Test Systems in Device

Assembly

Advantest

TR1000T

Assembly

Advantest

T5382A

Memory Tester (Single head#2)

Assembly

Advantest

T5382A

Memory Tester (Dual head)

Assembly

Advantest

T5581P

Memory Tester (Single head)

Assembly

Aehr

MTX 3000 H/A

Assembly

AERONCA

WIS-100

Wafer Surface Inspection System

Assembly

AERONCA

WIS-900

Wafer Surface Inspection System, 2ea Available

Assembly

AG ASSOCIATES

2106

Rapid Thermal Processing System, for 100mm-150mm Wafers

Assembly

AG ASSOCIATES

2146

Rapid Thermal Processing System, Parts Tool Only

Assembly

AG Associates

610 Heatpulse

RTA Rapid Thermal Annealing

Assembly

AG Associates

4100 Heatpulse

RTA Rapid Thermal Annealing

Assembly

AG Associates

Heatpulse 410

RTA Rapid Thermal Annealing

Assembly

AGIDENT

16442A

Parameter Analyzer Tool

Assembly

Agilent

1100

Assembly

Agilent Technologies

V4400

Assembly

Agilent Technologies

V4400

Assembly

Air Liquide

See Listing

Gas VMBs

Assembly

Aixacct

TF Analyzer 2000

Assembly

Aixtron

AIX200

LP-MOCVD Chemical Vapor Deposition

Assembly

AKRION

V2-HL.2000

Hybrid-Linear Automatic Acid Wet Station with Robotic Transfer (New), for Dual 150mm Cassettes

Assembly

AKRION

V2-SA.3200

Semi-Automatic Acid Wet Station w/Robotic Transfer, 7 Tanks for Dual 150mm Cassettes

Assembly

AKRION

V2-SA.3200

Semi-Automatic S/S Solvent Wet Station (New)

Assembly

Alcatel

2441C

RF Sputter UP system

Assembly

ALESSI

REL-4500

Analytical Manual Wafer Prober - Parts Tool Only

Assembly

Alpha Innotech

FA-1000

Photo Emission Microscopy System

Assembly

Alphasem

SL9002-MM

Flip Chip bonder

Assembly

ALPHASEM

Swissline 9006

Automatic Epoxy Die Bonder, 2ea Available

Assembly

AMAT

8" Susceptor

Calibration Leveling tool

Assembly

AMAT

AME8330

Assembly

AMAT

AME8330

Assembly

AMAT

Centura 5200 CVD

1999, SACVD

Assembly

AMAT

Centura 5200 RTP

200mm

Assembly

AMAT

Centura 5200 RTP

200mm

Assembly

AMAT

Centura 5200 RTP

2000, 200mm

Assembly

AMAT

Centura 5300

200mm

Assembly

AMAT

Centura DPS+

1999, 200mm

Assembly

AMAT

Centura eMAX

Oxide Etch

Assembly

AMAT

CENTURA II DPS+

2002, 200mm

Assembly

AMAT

Centura II Super E

2000, Oxide Etch

Assembly

AMAT

Centura II Super E

2000, Oxide Etch

Assembly

AMAT

Centura MXP

Poly Etch

Assembly

AMAT

E-Max Chamber Assy

200mm

Assembly

AMAT

E-Max Chamber Assy

200mm

Assembly

AMAT

E-Max Chamber Assy

200mm

Assembly

AMAT

P5000

MxP+ Etch

Assembly

AMAT

P5000

TEOS

Assembly

AMAT

P-5000

Poly Etch

Assembly

AMAT

P-5000

TiN CVD

Assembly

AMAT

P-5000

CVD

Assembly

AMAT

P-5000

1995.10, 200mm

Assembly

AMAT

P-5000

1994, 200mm

Assembly

AMAT

P5000 ETCH

200mm

Assembly

AMAT

P5000 ETCH

200mm

Assembly

AMAT

P5000 ETCH

200mm

Assembly

AMAT

P5000 MK-II

TEOS CVD

Assembly

AMAT

P5000C

SIN CVD

Assembly and Test

AMAT

P5000Wxz

W-CVD

Assembly and Test

AMAT

PE8330

METAL Etch

Category

AMAT

PE8330

METAL Etch

Clean

AMAT

PE8330

METAL Etch

CMP

AMAT

PI9500

High Current Implanter

CMP

AMAT

PI9500

High Current Implanter

CMP

AMAT

PI9500

High Current Implanter

CMP

AMEL Instruments

Instruments Model 2049

CMP

AMEL Instruments

Instruments Model 2053

CMP

Amtech/Tempress

Amtech/Tempress Atmoscan System (New in crate)

CMP

Anatech Hummer

6.2

CMP

Anelva

I-1060 SVII Plus-1

Co-Sputter

CMP

Anelva

I-1060SV II

Alminium Sputter

CMP

Anelva

ILC-1060SV

Sputter

CMP

APEX

F636A-01 (Cruise 2000)

MOCVD LCSVD

CMP

Applied Material Orbot WF736

Tester

CMP

Applied Materials

5300

Etcher

CMP

APPLIED MATERIALS

8330

Hexode Plasma Etchers for 125mm Wafers

CMP

Applied Materials

8330

Metal Etcher

CMP

Applied Materials

9200

CMP

Applied Materials

9500

CMP

Applied Materials

5200 Centura

CMP

Applied Materials

8300A-0020

Oxide Etcher

CMP

Applied Materials

AMAT 5200 CENTURA

CMP

Applied Materials

AMAT P5000

CVD

CMP

Applied Materials

AMAT P5000

CMP

Applied Materials

AMAT ULTIMA X  300MM

HDPCVD

CMP

Applied Materials

Centura 5200 DPN

CMP

Applied Materials

Centura 5200 DPN

CMP

Applied Materials

Centura 5200 Metal Etch MxP

CMP

Applied Materials

Centura 5200 Oxide Etch MxP+

CVD

Applied Materials

Centura RTP XE+/Wsix

CVD

Applied Materials

Centura SACVD

CVD

Applied Materials

Compass

CVD

APPLIED MATERIALS

DR SemVision

SEM Based Defect Review System

CVD

Applied Materials

Excite 

High Speed Particle Detection

CVD

Applied Materials

Excite IPM

Unpatterned Wafer Inspection

CVD

Applied Materials

HDPEtch Chamber

CVD

Applied Materials

IPM 832

CVD

Applied Materials

P5000

CVD

CVD

Applied Materials

P5000 Mark II Metal

CVD

Applied Materials

P5000 Mark II Metal

CVD

Applied Materials

P5000 Mark II Metal

CVD

Applied Materials

P5000 Mark II Metal

CVD

Applied Materials

Reflexion - ILD

CVD

APPLIED MATERIALS

Type 3

On Board TEOS Hot Box, 6 Channels

CVD

Applied Materials

5000

3 Ch SACVD System, refurbished

CVD

Applied Materials

5000

3 Ch Silane PECVD system, refurbished

CVD

Applied Materials

Centura 5200

2 Ch DPS R1 poly etch system, refurbished

CVD

Applied Materials

Centura 5200

3 Ch eMxP+ oxide etch system, refurbished

CVD

Applied Materials

Centura 5200

4 Ch DXZ PECVD System, refurbished

CVD

Applied Materials

Centura 5200

4 Ch DXZ SACVD System, refurbished

CVD

Applied Materials

Centura 5200

Ald Centura System

CVD

Applied Materials

Centura 5200

MxP Etch system - Oxide 200mm

CVD

Applied Materials

Opal 7830i

CD SEM

CVD

Applied Materials

SEM VISION CX

SEM

CVD

APT

3145

Metal Etch Tools with Robotic Handling, for 75mm to 200mm Wafers, 2ea Available

CVD

Arch

Genstream

Arch Teos Delivery System (New) 

CVD

ASM

Polygon Platform

Thin Film

CVD

ASML

2500/40

i-Line Wafer Stepper

CVD

ASML

PAS 5000 / 45

STEPPER

CVD

ASML/SVG US INC

MSII+

Track

CVD

ASML/SVG US INC

SERIES 90-S

Track

CVD

ASML/SVG US INC

SERIES 90-S

Track

CVD

Asyst

SMIF 300 WMS

Wafer Management system

CVD

Atcor

CRD-2410

Box Washer

CVD

Avsi

AVSI 480BT

CVD

Axcelis

200 PCU

CVD

Axcelis

200PCU

Photostabilizer

CVD

Axcelis

AC2

Ozone Asher

CVD

Axcelis

HC3 Ultra 5.5

Ion Implanter- 300mm-13 wafer batch- 4 PDOs- full 300mm factory automation-exc condition

CVD

Axcelis / Fusion

200 ACU

Ashing System

CVD

Axcelis / Fusion

M 200 PC

UV Cure System

CVD

Balzers

BAK 760

High Capacity High Vacuum Evaporation System

CVD

Bay Voltex HS 0550-AC-SX-ENL

HS 0550-AC-SX-ENL

CVD

Bay Voltex LT-1650-WC-DI-AM Chiller

LT-1650-WC-DI-AM Chiller

CVD

Benchmark Gen II

SM-8000

Parallel Seam Sealer

CVD

Biorad

Bio-RAD

Overlay and CD Measurement System

CVD

Biorad

Bio-RAD

Overlay and CD Measurement System

CVD

BIORAD

Q6

Overlay Metrology Tool

CVD

BIORAD

Q7/Q8

Overlay Metrology Tool for up to 200mm Wafers, 3ea Available

CVD

BIORAD

QS-300

FTIR Epi Thickness Monitor for up to 150mm Wafers

CVD

BIORAD

QS-300

FTIR Epi Thickness Monitor for up to 200mm Wafers

CVD

BIORAD

QS-500

FTIR Epi Thickness Monitor for up to 200mm Wafers

CVD

Blue M

DCC-256F

Oven

CVD

Blue M

IGF-6680F-4

Blue M Ultra Temp Oven 

CVD

Blue M

DCC 256C

Cleanroom Oven

CVD

Blue M

Model CW-190G-MP2

High Temp Oven

CVD

Blue M

Model DCC-146C

CVD

Bold

PT1180, PT1184

Bold Recirculators

CVD

Branson

IPC 4000

Barrel Asher

CVD

Brewer Science

CEE 100 System

CVD

Brooks

8100

CVD

Brooks

various

Brooks Mass Flow Controllers 

CVD

Buehler

Budzar Ice Chiller

Chiller

CVD

Cannon

FPA-3000-i4

Wafer Stepper

CVD

Cannon

FPA-3000-i4

Wafer Stepper

Defect Metrology

Cannon

FPA-3000-i4

Wafer Stepper

Defect Metrology

Cannon

FPA-3000-i5

Wafer Stepper

Diffusion

Cannon

FPA-3000-iW

Wafer Stepper

Diffusion

Cannon

FPA-3000-iW

Wafer Stepper

Diffusion

Canon

1550

Mark V steppers, G line

Diffusion

Canon

Aligner(PLA-501FA)

Diffusion

CANON

APT5850

TEOS-3 CVD

Diffusion

Canon

FPA 1550

g line stepper

Diffusion

Canon

FPA1550M3W

g line stepper

Diffusion

CANON

MAS8000

Asher

Diffusion

CANON

MAS8000

Asher

Diffusion

CANON

MAS8000

Asher

Diffusion

CANON

MAS8000

Asher

Diffusion

CANON

MAS-8000

Asher

Diffusion

CANON

MAS-801

Asher

Diffusion

Canon

MPA 500

Projection Mask Aligner

Diffusion

Canon

PLA 501F

Parallel Light Mask Aligner Cassette to cassette Mask aligner for 2"-5" wafer

Diffusion

CANON

PLA501FA

Mask Aligner

Diffusion

Canon

PLA 501F

Parallel Light Mask Aligner Cassette to cassette Mask aligner for 2"-6" wafer

Diffusion

Carl Zeiss

MSM100 / AIMS

Diffusion

CDE

ResMap 378

Resistivity Mapping Tool, for up to 300mm Wafers

Diffusion

CDE

ResMap168

Automated four point probe for resistivity and metal thickness mapping

Diffusion

CHA

MPS 4

Multiposition Horizontal Sputtering system

Diffusion

CHA

SSB 600

Single Target DC Magnetron Sputting system

Diffusion

Chapman

MP 2000 Plus

Laser Profiler

Diffusion

CR TECHNOLOGY

CRX-1000

Real Time Xray Imaging System

Diffusion

Creative Design Engineering (CDE)

ResMap 463

Diffusion

Creative Design Engineering (CDE)       

ResMap 463

Diffusion

Credence

212

Parts Machine Only

Diffusion

Credence

IDS2000

Tester

Diffusion

Credence

Kalos PK1

Automated Test Prober for Flash Memory

Diffusion

Credence

Personal Kalos

Diffusion

CVC

611

Loadlock Deposition System Sputter Capability up to 6"

Diffusion

Daito Shoji

F-3555

RETICLE INSPECTION

Diffusion

Dektak

3 Series

Surface profilometer and step height measurement

Diffusion

Delatech

858-4

Delatech CDO System 

Diffusion

Delta Design

1020 FLEX HNDLR

Handler

Diffusion

Delta Design

1020 FLEX HNDLR

Handler

Diffusion

Delta Design

1210 FLEX HNDLR

Handler

Diffusion

DELTRONIC

DV-114

Optical Comparator with Digital XY Readout

Diffusion

Despatch

CRB

Diffusion

DISCO

DFD620

Dicing Saw

Diffusion

DJ-807

Kokusai

4 Chamber Furnace w/ preclean

Diffusion

DNS

626

Coater, Developer

Diffusion

DNS

DNS-629

PR Coater

Diffusion

DNS

DNS-629

PR Coater

Diffusion

DNS

DNS-629

PR Coater

Diffusion

DNS

FC-821L

1 BATH RCA SCRUBBER

Diffusion

DNS

FC-821L

Diffusion

DNS

FC-821L

Diffusion

DNS

SC-W60A-AVFG

SOG Coater

Diffusion

DNS

SCW-80A-AV(Q)

POLYMID COATER

Etch

DNS

SC-W80A-AVFG

SOG Furnace with Interface

Etch

DNS

SC-W80A-AVG

SOG Coater

Etch

DNS

SK200W-RVPE

Track System

Etch

DNS

SK-W80A-BVP

Photoresist Coater/Developer, 3 Coat, 2 Develop, 200mm Wafers

Etch

DNS

SK-W80A-BVP

Track System

Etch

DNS

SKW-80A-BVPE

Photoresist Coater/Developer, 1 Coat, 2 Develop, WEE for 200mm Wafers

Etch

DNS

SR-3000

Cleaner

Etch

DNS

SS-W80AAR

Etch

DNS

VM-8200

Thickness Measurement

Etch

DNS

VPC

Etch

DNS

WS-820C

Automated Wet Processing System with IPA Vapor Dryer,  200mm Wafers

Etch

DNS

629

PR coater

Etch

DNS

W80

SOG Coater

Etch

DNS- Dainipponscreen

DP-636-C

3 Tracks with each 3 hotplate and 1 coolplate. Each track has 1 carrier send and 1 receive.

Etch

DNS-Dainipponscreen

DP-636-C

1 Coater unit 4 Hotplates 2 Coolplates 4 Carriers 2 coating systems with pressuredispence from the tank/bottle each is suported with a traptank. Suitable for any Type of Photoresist.

Etch

Dryden

DE3496SPD

Etch

Drytek

Megastrip 6

Drytek Megastrip 6

Etch

Duo

Credence

VLSI, Tester 50/100 Mhz Conf. 60Mhz 1digital capture board W/8 pins, 2 abbitary waveform Generator boards for 16 pins AWG.

Etch

Dupont

120ssa

Helium Leak Detector

Etch

DUSAN

Smart Die

Trim & Form Press, 5ea Available

Etch

DYNATEX

DX-III

Wafer Scriber/Breaker

Etch

E G & G Instruments

Model 263A

Etch

EALING INSTRUMENTS

6' Long

Optical Bench

Etch

Eaton

H143 (NV-10-80)

Implant

Etch

Ebara

2.1

Ebara 2.1 Cryo Compressors 

Etch

Ebara

4.8

Ebara 4.8 Cryo Compressors 

Etch

Ebara

EPO

Ebara Integrated Polish Configurations

Etch

Edax

CM200ST Alpha 147-5

Failure Analysis

Etch

Edax

EDX

Failure Analysis

Etch

EEJA

POSFER

Etch

Electroglas

4085cx

Prober with hot chuck

Etch

Electroglas

4090u

Prober

Etch

Electroglas

5/300e

Prober, 300mm, hot/cold nickel chuck, -55degC-+200degC, Auto probe to pad, chiller, manip.

Etch

Electroglas

EG 4085

Prober

Etch

Electroglas

EG 4085X

Prober

Etch

Electroglas

Horizon 4085X

Automatic Wafer Prober

Etch

Electrotech

LF-24

Etch

EM-1

Prometrix

Etch

ENI

ACG-10

Generator

Etch

ENI

HF-1

Generator

Etch

EPRO

142AX

Memory Tester

Etch

Ergolux

Ergolux

Microscope

Etch

ESEC

2005 LOC

Automatic Die Bonder

Etch

ESEC

3006F/X

ESEC 30006F/X Wire Bonder

Etch

ESI

9800

Etch

ESI

9800

Etch

ESI

9800

Etch

ESI

9800

Etch

ESI

9250A

Laser Semiconductor Processing System, 1996

Etch

ESI

9250B

Laser Semiconductor Processing System, 1996

Etch

ESI

8000/200

Laser Processing System

Etch

ESI Inc

9820

Laser Repair

Etch

Estek

WIS-800

Etch

Estek Wis

600

Inspection System Wafer Surface Analysis System Capability 3" to 6" wafers.

Etch

ETS Lindgren

5407

Etch

Evertech

UNKNOWN

Etch

EVG

540 G2W

Die Bonder

Etch

Fein Focus

F3D-160-10(V)

Xray

Etch

FICO

TFM-1A

Lead Forming Tool

Etch

FLX2320

KLA-TENCOR

Etch

Fortrend

See Listing

Fortrend Wafer Transfers

Etch

Four Dimension Movec

280TC

Automated 4 Point Probe Capable of 100mm to 200mm wafers

Etch

FSI

8221

Spin Rinse Dryer

Etch

FSI

Excalibre

Vapor Cleaner

Etch

FSI

Excalibre

Vapor Cleaner

Etch

FSI Polaris

1000

Microlithography Cluster tool (Coat / Dev) Capability 3" to 6" wafers

Etch

Fusion

150 PC

UV systems

Etch

Fusion

150PC-200PCU- Gemini

Photostablilizers and EPROM erasers (dual application)

Etch

Fusion

200PC

Photostabilizer

Etch

Fusion

Asher

Etch

Fusion

Asher

Etch

Fusion

G03

Photostabilizer

Etch

Fusion

G03

Photostabilizer

Etch

Fusion

M200 PCU

Etch

Fusion Systems

PS3 UV Harden

Photoresist Curing

Etch

Fusion Systems

PS3 UV Harden

Photoresist Curing

Etch

GAERTNER

Stokes LSE

Ellipsometer, Manual 300MM max

Etch

Gasonics

AE2001

EtcherSingle wafer down-stream isotropic etch system

Etch

Gasonics

AE2001

Etcher Single wafer down-stream isotropic etch system

Etch

Gasonics

Aura 1000

Photoresist Asher 75mm to 150mm wafer capability

Etch

Gasonics

Aura 2000LL

Loadlock Asher Configured for 4"- 8" Wafers

Etch

Gasonics

Aura 2000LL

Loadlock Asher Configured for 4"- 8" Wafers

Etch

Gasonics

L3510

Single Wafer Ashing System Substrate Size: 3-8inch / 75mm-200mm

Etch

GCA/TROPEL

9000

Surface Flatness Analyzer

Etch

GD-Takatori

1100

Gold- Grind

Etch

GD-Takatori

2100

Gold- Grind

Etch

Gemini

Gemini 3

Dual Chamber Epitaxial Reactor

Etch

Gemini

Gemini II

Gemini II EPI Reator (Left Side Controller)

Etch

Gemini

Gemini II

Gemini II EPI Reator (Right Side Controller

Etch

Genesis

Tester II 

Tester II

Etch

Genesis 

Tester II

Tester II

Etch

Genus

Lynx 2

CVD

Etch

Geringer

Etch

GSI Lumonics

HM1400L

Laser Marking system

Etch

Hach One Laboratory

Hach One Laboratory PH/Meter

Etch

Hipox

Gasonics

w/Haskel Pumps, up to 125mm

Etch

Hirayama

PC305S III

Etch

Hirayama

PC305S III

Etch

HITACHI

4500

Etch

Hitachi

308 ATE

Poly Etcher

Etch

Hitachi

7280H

Etch

Hitachi

HI TECH 308

Etcher

Etch

Hitachi

HI TECH 308

Etcher

Etch

Hitachi

HI TECH 8820

Etch

HITACHI

IRG-10-T10

REVIEWER

Etch

Hitachi

IS-2000

Total Reflection X-Ray Fluorescence   TRXRF

Etchers

HITACHI

IS2500

WAFER INSPECTION

Etchers

HITACHI

LS-6030K

Particle Inspection

Implant

HITACHI

S-4160

FE-SEM

Implant

Hitachi

S-4500

Implant

Hitachi

S-6000

CD SEM

Implant

Hitachi

S-6000

CD SEM

Implant

HITACHI

S-6000

Field Emission CDSEM, 2ea Available

Implant

Hitachi

S-7000

CD SEM

Implant

HITACHI

S-7000

CD SEM Measurement Tool, 2ea Available

Implant

Hitachi

S-7800

CD SEM

Implant

HITACHI

S-8820

CD-SEM

Ion Implantors

HITACHI

S-8820

200mm

Mask

HITACHI

S-9260

SEM

Mask

HITACHI

S-9260

SEM

Mask 

HITACHI

SEM S7000

Mask 

HITACHI

SEM S7800

Mask 

Hitachi

8820

CD Sem

Mask 

Holon

EMU220

Mask 

Hypervision

Visionary 2000

Emission Microscope

Mask 

ICF

EKC Wet station

Mask 

ICF

Tube Cleaner for Vertical furnace

Metrology

ICP Multiplex

STS

Inductively coupled plasma, GaN Bluechip, vintage 2002

Metrology

IMS Tester

ATS 1271

Tester- spare system

Metrology

IMS Tester

ATS 1271 

Tester-full system

Metrology

Inficon

TRS-H200M

GAS ANALYZER

Metrology

Innolas

IL C 3000 DPS

Laser YAG

Metrology

Innotec

VS 24C

5 Target DC Sputtering System

Metrology

Inova

Novellus

PVD  200mm

Metrology

Inspex

TPC8500

Total Reflection X-Ray Fluorescence   TRXRF

Metrology

Inspex

TPC8520

Total Reflection X-Ray Fluorescence   TRXRF

Metrology

Inspex

TPC8525

Total Reflection X-Ray Fluorescence   TRXRF

Metrology

Inspex

TPC8525M

Total Reflection X-Ray Fluorescence   TRXRF

Metrology

Inspex

TPC8530

Total Reflection X-Ray Fluorescence   TRXRF

Metrology

Integrated Dynamics Eng

TC

Shock Vibration

Metrology

Ion Tech Inc

Sourcerer

Ion Beam System Dual Ion Beam Deposition

Metrology

IONIC

Stressgage

Wafer Film Stress Tester, 2ea Available

Metrology

IPEC

472 / 372M

Rotational CMP Platforms

Metrology

IPEC/Speedfam

Auriga / Auriga C

5-Head Standalone or Integrated CMP Polisher

Metrology

IRVINE OPTICAL

Ultrasort 606

Robotic Bar Code Reader/Wafer Sorter

Metrology

IRVINE OPTICAL

UltraSpec

Wafer Inspection Station with Nikon Optiphot 150 Optics, NeoPlan2  5X, 20X & 100X Obj

Metrology

IRVINE OPTICAL

UltraSpec III

Wafer Inspection Station with Nikon Optiphot, DIC Optics, Isolation Table

Metrology

IVI

Box Coater

48 inch thermal evaporator

Metrology

IVS

200

Wafer Inspection System

Metrology

JEOL

JSM-6360LV

Scanning Electron Microscope

Metrology

Jeol

JWS 7505

CD CEM

Metrology

JEOL

JWS 7515

Microscope

Metrology

JEOL

JWS 7700

CD Sem

Metrology

JEOL

JWS-7515

SEM Based Wafer Inspection Tool

Metrology

JLSI

IPS8653D

JLSI Test Handler

Metrology

JOEL

JWS-7700

Metrology

JWS 7515

JEOL

Metrology

K&S

1472

Wire Bonder

Metrology

K&S

6497

Semi-Automatic Flip Chip Die Bonder

Metrology

K&S

1470-4

Automatic Hybrid Wedge Bonder, 200mm x 200mm Travel

Metrology

K&S

1470-4

Automatic Hybrid Wedge Bonder, 100mm x 100mm Travel

Metrology

Karl Suss

MA150

Mask Aligner

Metrology

KARL SUSS

MJB-3

Mask Aligner with Split-Field Optics, Model 505 UV Power Supply

Metrology

KARL SUSS

RA120M

Wafer Scriber

Metrology

Karl Suss

MA-150ML

Manual Mask Aligner w/ Video Backside Alignment

Metrology

Karl Suss

MA56

Mask Aligner Exposure System

Metrology

Karl Suss

MA6

Mask Aligner / Exposure SystemSystem Capable of 2" to 6" Wafers

Metrology

Karl Suss

RA120M

Scriber

Metrology

Kensington 

CSMT-2

2 Stage Wafer Sorter

Metrology

KETEK

RMM 530

 Manual Load Rubbing Machine for LCDs

Metrology

Kevex

771 SEMICRON

Metrology

Kevex

Omicron XRF

Metrology

Kevex

Omicron XRF

Metrology

Kinergy

Auto Frame Loader

Assembly Hybrid

Metrology

Kinergy

Auto Frame Loader

Assembly Hybrid

Metrology

Kinetek

DRS 200

Optical Inspection and Defect Review StationSystem Capable of 4" to 8" Wafers

Metrology

KLA

Fab VARS 500

Digital Image Management System

Metrology

KLA

KLA2552

1998

Metrology

KLA

2131

 Defect Inspection System Upgraded to 2132 4" to 8" Water Capability

Metrology

KLA

2132

High Speed Multilayer Wafer Inspection for Process Defects

Metrology

KLA

Tencor P20H

Long Scan Profiler Capability to handle 3" to 8" wafer

Metrology

KLA  Tencor

6200

Surfscan Wafer Surface Contamination Analyzer Capable up to 8" Wafers

Metrology

KLA  Tencor

6220

Surfscan Wafer Surface Inspection System 4" to 8" Water Capability

Metrology

KLA  Tencor

6420

Surfscan Unpatterned Surface Inspection System  Capable up to 8" Wafers

Metrology

KLA  Tencor

Alpha Step 200

Profiler System  Capability to handle 3" to 8" wafer

Metrology

KLA  Tencor

Flexius  FLX 2320

Thin Film Stress Measurement System Wafer Sizes:100 to 200mm

Metrology

KLA  Tencor

M-Gage 300

Non-Contact Mettallization Monitor Capability Capability 2" to 6" wafers

Metrology

KLA  Tencor

P2

Long Scan Profilometer Sample Size: up to 200 mm

Metrology

KLA  Tencor

Surfscan 354

Capability 2" to 5" wafers

Metrology

KLA  Tencor

Surfscan 4500

Surface Particle Inspection Analyzer Capability 3" to 6" wafers

Metrology

KLA  Tencor

Surfscan 5500

Surface Particle Inspection Analyzer Capability 4" to 8" wafers

Metrology

KLA  Tencor

Surfscan 7000

Pattern particle and microscan

Metrology

KLA  Tencor

Surfscan 7200

Patterned Wafer Particle Inspection SystemSubstrate Size: 4"to 8

Metrology

KLA  Tencor

Surfscan 7700

Surfscan Patterned / Unpatterned Wafer Inspection System

Metrology

KLA  Tencor

TF1

Film Thickness Measurement System Substrate Size: 4" to 8"

Metrology

KLA  Tencor

TF2

Film Thickness Measurement System Capability 100 to 200mm wafer